Hydrofluoric acid 4,9%, CMOS for microelectronic, J.T.Baker®

5397-03EA 0 EUR
5397-03
Hydrofluoric acid 4,9%, CMOS for microelectronic, J.T.Baker®
Hydrofluoric acid
Formula: HF
MW: 20,01 g/mol
MDL Number: MFCD00011346
CAS Number: 7664-39-3
EINECS: 231-634-8
UN: 1790
ADR: 8,II

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Specification Test Results

For Microelectronic Use
Assay (HF) 4.80 - 5.00 %
Color (APHA) ≤10
Fluosilicic Acid (H₂SiF₆) ≤0.010 %
Residue after Ignition ≤1 ppm
Chloride (Cl) ≤3 ppm
Nitrate (NO₃) ≤2 ppm
Phosphate (PO₄) ≤0.7 ppm
Sulfate and Sulfite (as SO₄) ≤3 ppm
Trace Impurities - Aluminum (Al) ≤50.0 ppb
Arsenic and Antimony (as As) ≤30.0 ppb
Trace Impurities - Barium (Ba) ≤20.0 ppb
Trace Impurities - Boron (B) ≤20.0 ppb
Trace Impurities - Cadmium (Cd) ≤20.0 ppb
Trace Impurities - Calcium (Ca) ≤50.0 ppb
Trace Impurities - Chromium (Cr) ≤10.0 ppb
Trace Impurities - Cobalt (Co) ≤20 ppb
Trace Impurities - Copper (Cu) ≤10.0 ppb
Trace Impurities - Gallium (Ga) ≤20.0 ppb
Trace Impurities - Germanium (Ge) ≤50.0 ppb
Trace Impurities - Gold (Au) ≤10.0 ppb
Heavy Metals (as Pb) ≤100 ppb
Trace Impurities - Iron (Fe) ≤50.0 ppb
Trace Impurities - Lead (Pb) ≤20.0 ppb
Trace Impurities - Lithium (Li) ≤20.0 ppb
Trace Impurities - Magnesium (Mg) ≤50.0 ppb
Trace Impurities - Manganese (Mn) ≤20.0 ppb
Trace Impurities - Nickel (Ni) ≤20.0 ppb
Trace Impurities - Potassium (K) ≤50 ppb
Trace Impurities - Silicon (Si) ≤1000.0 ppb
Trace Impurities - Silver (Ag) ≤10.0 ppb
Trace Impurities - Sodium (Na) ≤100.0 ppb
Trace Impurities - Strontium (Sr) ≤20.0 ppb
Trace Impurities - Tin (Sn) ≤50 ppb
Trace Impurities - Titanium (Ti) ≤50.0 ppb
Trace Impurities - Zinc (Zn) ≤50 ppb
Particle Count - 0.5 µm and greater ≤60 par/ml
Particle Count - 1.0 µm and greater ≤8 par/ml

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