Orthophosphoric acid ≥85%, CMOS™ for microelectronic, J.T.Baker®

Supplier: Avantor

0264-05EA 0 EUR
0264-05
Orthophosphoric acid ≥85%, CMOS™ for microelectronic, J.T.Baker®
Orthophosphoric acid
Formula: H₃PO₄
MW: 98 g/mol
Melting Pt: 28 °C
Density: 1,71…1.87 g/cm³ (25 °C)
MDL Number: MFCD00011340
UN: 1805
ADR: 8,III

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Specification Test Results

Assay (H₃PO₄) (by acidimetry) 85.0 - 87.0 %
Color (APHA) ≤ 10 5
Specific Gravity at 60°/60°F 1.691 - 1.710
Reducing Substances Passes Test
Volatile Acids (µeq/g) ≤ 0.16
Chloride (Cl) ≤ 1 ppm
Nitrate (NO₃) ≤ 2 ppm
Sulfate (SO₄) ≤ 12 ppm
Trace Impurities - Aluminum (Al) ≤ 0.500 ppm
Trace Impurities - Antimony (Sb) ≤ 10.000 ppm
Trace Impurities - Arsenic (As) ≤ 0.050 ppm
Trace Impurities - Calcium (Ca) ≤ 1.500 ppm
Trace Impurities - Chromium (Cr) ≤ 0.200 ppm
Trace Impurities - Cobalt (Co) ≤ 0.050 ppm
Trace Impurities - Copper (Cu) ≤ 0.050 ppm
Trace Impurities - Gold (Au) ≤ 0.300 ppm
Trace Impurities - ACS - Heavy Metals (as Pb) ≤ 5 ppm
Trace Impurities - Iron (Fe) ≤ 2.000 ppm
Trace Impurities - Lead (Pb) ≤ 0.300 ppm
Trace Impurities - Lithium (Li) ≤ 0.100 ppm
Trace Impurities - Magnesium (Mg) ≤ 0.20 ppm
Trace Impurities - Manganese (Mn) ≤ 0.100 ppm
Trace Impurities - Nickel (Ni) ≤ 0.200 ppm
Trace Impurities - Potassium (K) ≤ 1.500 ppm
Trace Impurities - Sodium (Na) ≤ 2.500 ppm
Trace Impurities - Strontium (Sr) ≤ 0.100 ppm
Trace Impurities - Titanium (Ti) ≤ 0.300 ppm
Trace Impurities - Zinc (Zn) ≤ 2.000 ppm
Particle Count - 1.0 µm and greater ≤ 10 par/ml
For Microelectronic Use
Storage Conditions Store at temperatures above 22°C (72°F)

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